Selected Publications
2016-present:
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Strategies for dislocation density reduction in CdTe epilayers grown directly on (211) Si substrates using MOVPE, J. Mater Sci: Mater Electron, vol. 35, 31 (1-6), 2024.01. (DOI: 10.1007/s10854-023-11842-4)
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Dislocation reduction in an MOVPE-grown CdTe/Si epilayer by ex-situ annealing and its effect on the performances of gamma ray detectors fabricated, Physica Scripta, vol. 99, 015931(1-7), 2024.01. (DOI: https://doi.org/10.1088/1402-4896/ad14d4)
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Dislocation Density Reduction in MOVPE-Grown (211)CdTe/Si by Post-Growth Pattering and Annealing, J. Elect. Materials, vol.52, pp. 3431-3435, 2023.03. (DOI: 10.1007/s11664-023-10318-9)
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Growth and Characterization of Single-Crystal Lead Halide Perovskites for X-ray Detector Application, IEEE Trans. Nucl. Sci., vol. 70, no. 2, pp. 173-176, 2023.02 (DOI:10.1109/TNS.2022.3230401)
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Low-Temperature Annealing of CdTe Detectors With Evaporated Gold Contacts and Its Effect on Detector Performance, IEEE Trans. Nucl. Sci., vol. 69, no. 8, pp. 1960-1964, 2022.08. (DOI: 10.1109/TNS.2022.3180009)
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Analysis of dislocations and their correlation with dark currents in CdTe/Si heterojunction diode-type x-ray detectors, J. Appl.Phys., vol.130, 055302, (2021) (DOI: 10.1063/5.0058504
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Properties of iodine-doped CdTe layers on (211) Si grown at high substrate temperatures by MOVPE, J. Elect. Materials, vol.49, No. 11, pp. 6996-6999, 2020.11 (DOI: 10.1007/s11664-020-08420-3)
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Synchrotron characterization of high-Z, current-mode x-ray detectors, Review of Scientific Instruments, vol. 91, issue 2, 023509, 2020.02 ( https://doi.org/10.1063/1.5139403)
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Metalorganic Vapor Phase Epitaxy of Thick and Uniform Single Crystal CdTe Epitaxial Layers on (211) Si Substrates for X-ray Imaging Detector Development, J. Elect. Materials, vol. 48, no. 12, pp. 7680-7685, 2019.12 (DOI: 10.1007/s11664-019-07601-z)
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Characterization of Fine-Pixel X-ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE, IEEE Trans. Electron Devices, vol. 66, no. 1, pp. 518-523, 2019.01. DOI: 10.1109/TED.2018.2883325
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Post Growth Annealing of MOVPE-Grown Single Crystal CdTe Epilayers on (211) Si Substrates, IEEE Trans. Nucl. Sci., vol. 65, No. 8, pp. 2325-2328, 2018.08. (DOI:10.1109/TNS.2018.2855751)
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Development of Large-Area CdTe/n+-Si Epitaxial Layer Based Heterojunction Diode-Type Gamma-Ray Detector Arrays, IEEE Trans. Nucl. Sci., vol. 65, no. 4, pp. 1066-1069, 2018.04 ( DOI:10.1109/TNS.2018.2812154)
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Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor- Phase Epitaxy, J. Elect. Materials, vol. 46, no. 11, pp. 6704-6708, 2017.10 (DOI: 10.1007/s11664-017-5703-6) link
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Dry Etching Characteristics of MOVPE Grown CdTe Epilayers in CH4, H2, Ar ECR Plasmas, J. Elect. Materials, vol. 46, no. 9, pp. 5400-5404, 2017.9. (DOI: 10.1007/s11664-017-5528-3) link
Improving the Performances of CdTe Gamma Ray Detectors by H2/Ar ECR Plasma Processing, IEEE Electron Device Letter, vol. 37, No.8, pp. 1059-1062, 2016.8. (DOI: 10.1109/LED.2016.2580675)
2011-2015:
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Surface Processing of CdTe Detectors Using Hydrogen Bromide-Based Etching Solution, IEEE Electron Device Letter, vol. 36, issue 8, pp. 856-858, (2015) (DOI: 10.1109/LED.2015.2450835)
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Development of Large-Area Imaging Arrays Using Epitaxially Grown Thick Single Crystal CdTe Layers on Si Substrates, IEEE Trans. Nucl. Sci., vol. 61, no. 5, pp. 2555-2558, (2014) (DOI: 10.1109/TNS.2014.2347374)
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Development of Nuclear Radiation Detectors by Use of Thick Single-Crystal CdTe Layers Grown on (211) p+-Si Substrates by MOVPE, J. Elect. Materials, vol. 43, no. 8, pp. 2860-2863, (2014) (DOI: 10.1007/s11664-014-3132-3)
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Vapor-phase epitaxial growth of thick single crystal CdTe on Si substrate for x-ray, gamma ray spectroscopic detector development, phys. stat. sol ( c), vol. 11, no. 7-8, pp. 1333-1336, (2014) (DOI:10.1002/pssc.201300559)
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Charge transport properties of p-CdTe/n-CdTe/n+-Si diode-type nuclear radiation detectors based on metalorganic vapor-phase epitaxy-grown epilayers, J. Appl. Phys., vol. 114, issue 16, 164510, (2013). (DOI: 10.1063/1.4828479)
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Postgrowth Annealing of CdTe Layers Grown on Si Substrates by Metalorganic Vapor-Phase Epitaxy, J. Elect. Materials, vol. 42, no. 11, pp. 3125-3128, (2013). (DOI: 10.1007/s11664-013-2680-2)
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MOVPE Growth of Thick Single Crystal CdZnTe Epitaxial Layers on Si Substrates for Nuclear Radiation Detector Development, IEEE Trans. Nucl. Sci., vol. 60, no. 4, pp. 2859-2863, (2013). (DOI: 10.1109/TNS.2013.2263841) pdf
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Fabrication and Characterization of X-Ray Spectroscopic Imaging Arrays Based on Thick Single-Crystal CdTe Epitaxial Layers, IEEE Trans. Electron Devices, vol. 59, issue 12, pp. 3450-3455, (2012)�@(DOI: 10.1109/TED.2012.2222413).
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Development of Spectroscopic Imaging Arrays Using Epitaxially Grown Thick Single Crystal CdTe Layers on Si Substrates, IEEE Trans. Nucl. Sci., vol. 59, no. 6, pp. 3201-3204, (2012).
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Dark Current Characteristics of a Radiation Detector Array Developed Using MOVPE-Grown Thick CdTe Layers on Si Substrate, J. Elect. Materials, vol. 41, no. 10, pp. 2754-2758, (2012).
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Fabrication of radiation imaging detector arrays using MOVPE grown thick single crystal CdTe layers on Si substrate, phys. stat. solidi (c), vol. 9, No. 8-9, pp. 1848-1851, (2012).
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MOVPE Growth of Thick Single Crystal CdZnTe Epitaxial Layers on Si Substrate for Nuclear Radiation Detector Development, IEEE 2012- 19th RTSD Conference Record, R07-1, pp. 4212-4215 (Invited) (2012).
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Post-Growth Annealing of CdTe Layers Grown on Si Substrtaes by MOVPE, The 2012 US Workshop on the Physics and Chemistry of II-VI Materials, Extended abstract, pp. 131-134 (2012).
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Development of Spectroscopic Imaging Arrays Using Epitaxially Grown Thick Single Crystal CdTe Layers on Si Substrates, IEEE 2011- RTSD Conference Record R05-1, pp. 4510-4513 (invited) (2011).
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Development of radiation imaging devices with energy discrimination capability using thick CdTe layers grown on Si substrates by metalorganic vapor phase epitaxy, Proc. SPIE , vol. 7995, 79952T1-6 (2011).
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Dark Current Characteristics of Radiation Detector Array Developed Using MOVPE Grown Thick CdTe Layers on Si Substrate, The 2011 US Workshop on the Physics and Chemistry of II-VI Materials, Extended abstract pp. 163-166 (2011).
2006-2010:
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Electrical Properties of Halogen-Doped CdTe Layers on Si Substrates Grown by Metalorganic Vapor-Phase Epitaxy, J. Elect. Materials, vol. 39, pp. 1118-1123, (2010)
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MOVPE Growth of Thick CdTe Layers on Si Substrate and Their Application to Radiation Detectors, Radiation, vol. 36, No. 2, pp. 41-48, (2010), (Division of Radiation Science, The Japan Society of Applied Physics, in Japanese)
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MOVPE Growth of CdTe on Si Substrates for Gamma Ray Detector Fabrication, IEEE Trans. Nucl. Sci.,IEEE Trans. Nucl. Sci, vol. 56, no. 3, pp.836-840, (2009)
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Electrical Properties of Iodine-Doped CdTe Epitaxial Films on Si Substrates Grown by MOVPE, IEEE Trans. Nucl. Sci.,IEEE Trans. Nucl. Sci, vol. 56, no. 4, pp.1731-1735, (2009)
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Fabrication and Characterization of MOVPE-Grown CdTe-on-Si Heterojunction Diode-Type Gamma-Ray Detectors, J.Elect.Materials, Vol.37, pp.1391-1395 (2008)
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Electrical Properties of Halogen-Doped CdTe Epitaxial Films on Si Substrates Grown by MOVPE, IEEE 2008-RTSD Conference Record R07-2(invited) (2008)
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Excimer Laser Etching Process of CdTe Crystals for Formation of Deep Vertical Trenches, J. Elect. Materials, Vol.36, pp.837-840 (2007)
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Characterization of CdTe/n+-Si Heterojunction Diodes for Nuclear Radiation Detectors, IEEE Trans. Nucl. Sci., Vol54, No4, pp.817-820 (2007)
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Fabrication abd Characterization of MOVPE-Grown CdTe-on-Si Heterojunction Diode-Type Gamma-Ray Detectors, The 2007 US Workshop on the Physics and Chemistry of II-VI Materials, Extended Abstracts, pp.39-42 (2007)
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Development of Heterojunction Diode-Type Gamma Ray Detectors Based on Epitaxially Grown Thick CdTe on n+-Si Substrates, IEEE Electron Device Letters, Vol.27(11), pp.-890-892 (2006)
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Characterization of CdTe/n+-Si Heterojyunction Diodes for Nuclear Radiation Imaging Detectors, IEEE 2006 15th Intern. Workshop on R-T. Semicon. X-and Gamma Ray Detectors(RTSD) Conference Record(Invited), pp.R14-8 (2006)
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Direct Growth og High-Quality Thick CdTe Epilayers on Si(211) Substrates by Metalorganic Vapor Phase Epitaxy for Nuclear Radiation Detection and Imaging, J. Elect. Materials, Vol.35(6), pp.1257-1261 (2006)
2000-2005:
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Control of Zn Composition (01-xZnxTe Epitaxial Layers on GaAs Substrates Grown by MOVPE, Applied Surface Science, Vol.244, pp.347-350 (2005)
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Development of Nuclear Radiation Detectors with Energy Resolution Capability Based on CdTe-n+-GaAs Heterojunction Diodes, IEEE Electron Device Letter, vol.26, pp.8-10 (2005)
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Direct growth of high-quality CdTe epilayers on Si (211) substrates by metalorganic Vapor-phase epitaxy, Journal of Crystal Growth, Vol.284, pp.15-19 (2005)
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Development of Nuclear Radiation Detectors With Energy Discrimination Capabilities Based on Thick CdTe Layers Grown by Metalorganic Vapor Phase Epitaxy, IEEE Transactions on Nuclear Science, Vol.52, No.5, pp.1951-1955 (2005)
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Development of Nuclear Radiation Detectors Based on Epitaxially Grown Thick CdTe Layers on n+-GaAs Substrates, J. Elect. Materials, Vol.34, pp.815-819 (2005)
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Direct Growth of High-quality Thick CdTe Epilayers on Si(211) Substrates by Metalorganic Vapor Phase Epitaxy for Nuclear Radiation Detection and Imaging, Ext.Abstract 2005 US Workshop on the Phys. Chem. II-VI Materials, pp.73-76 (2005)
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Optical Emission Characteristics of Ablation Plasma Plumes During The Laser-Etching Process of CdTe, J. Elect. Materials, Vol34, pp.1428-1431 (2005)
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Growth of Thick CdTe Epilayers on GaAs Substrates and Evaluation of CdTe/n+-GaAs Heterojunction Diodes for an X-ray Imaging Detector, J. Elect. Materials, Vol33, pp. 645-650 (2004)
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Surface Processing of CdTe Crystals by an Excimer Laser and its Application in Fabricating Nuclear Radiation Detectors, Phys. Sta. Sol.(c) vol.1, No.4, pp.1071-1074 (2004)
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MOVPE Growth of thick CdTe Heteroepitaxial Layers for X-ray Imaging Detectors, Phys. Sta. Sol.(c) vol.1, No.4, pp.1075-1078 (2004).
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Development of CdTe Nuclear Radiation Detectors for Spectroscopy and Imaging Applications, IEEE 2003 -RTSD Conference Record R2-2.
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Energy Discriminated Imaging for Gamma-ray by 128 Pixels CdTe High-Energy Radiation Imaging Device, IEEE 2003 -RTSD Conference Record R17-4.
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MOVPE growth and characterization of thick (100) CdTe layers on (100) GaAs and (100) GaAs/Si substrates, J. Elect. Materials, vol. 32, pp. 728-732 (2003).
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Influence of laser irradiation and laser-induced In doping on photoluminescence of CdTe crystals, Semicond. Sci. Technol. vol. 18, pp. 560-565, 2003.
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Diode type CdTe strip and linear array detectors for gamma-ray detection and imaging, IEEE Trans. Nucl. Sci., vol. 49, pp. 2250-2255, 2002.
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Growth Conditions of Iodine doped n+-CdTe Layers in MOVPE, J. Elect. Materials,vol. 31, pp.785-790, 2002.
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Excimer laser processing for the integrated gamma-ray detectors, SPIE Proc. vol. 4784, pp. 305-314, 2002.
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p-i-n CdTe 128-pixel detector for gamma-ray imaging fabricated by excimer laser processing, SPIE Proc. vol. 4784, pp. 259-268, 2002.
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Growth and characterization of thick (100) CdTe layers on (100) GaAs and (100) GaAs/Si substrates by metalorganic vapor phase epitaxy, Jpn. J. Appl. Phys., vol. 41, pp. L1109-L1111, 2002.
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Stability issues of high-energy resolution diode type CdTe nuclear radiation detectors in a long-term operation, Nucl. Instr. Methods. Phys. Research A, vol. 491, pp.168-175, 2002.
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Low-temperature growth, doping of CdTe epilayers on CdTe substrates in a remote-plasma-assisted MOCVD system for the nuclear radiation detector applications, physica status solidi b, vol. 229, pp. 83-87, 2002.
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A new fabrication technique of CdTe strip detectors for gamma-ray imaging and spectroscopy, physica status solidi b, vol. 229, pp. 1103-1107, 2002.
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Growth and Characterization of Cubic-CdS Layer on (100) GaAs in Metalorganic Vapor-Phase Epitaxy, J. Crys. Growth, vol.222, pp.477-481, 2001.
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Multi-pixel p-i-n CdTe array fabricated by laser processing, Radiation, vol. 27, pp. 23-28, 2001. (Division of Radiation Science, The Japan Society of Applied Physics, in Japanese)
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Shallow junction formation on p-like CdTe crystals by indium diffusion using excimer laser annealing, J. Elect. Materials, vol. 30, pp. 911-916, 2001.
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Excimer laser doping techniques for II-VI semiconductors, Applied Surface Science, vol. 175/176, pp. 462-467, 2001.
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High-resolution CdTe nuclear radiation detectors in a new M-p-n design, Nucl. Instr. Methods. Phys. Research A, vol. 458, pp. 478-483, 2001.
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Fabrication of CdTe strip detectors for imaging applications, Nucl. Instr. Methods. Phys. Research A, vol. 458, pp. 339-343, 2001.
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Growth Characteristics of CdZnTe Layers in Metalorganic Vapor-Phase Epitaxy, J. Crys. Growth, vol. 214/215, pp. 19-24, 2000.
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Low-temperature processing heavily doping by epitaxial growth and laser annealing for the fabrication of CdTe gamma-ray detectors, SPIE Proc. Vol. 4141, pp. 226-234, 2000.
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Performance of CdTe Gamma-Ray Detectors Fabricated in a New M-pi-n Design, J. Crys. Growth. vol. 214/215, pp. 1116-1120, 2000.
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Pattern doping on CdTe by excimer laser irradiation, J. Crys. Growth, vol. 214/215, pp. 520-523, 2000.
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Low temperature growth and n-type doping of CdTe by remote-plasma-assisted metalorganic chemical vapor deposition method, VACUUM, vol. 59, pp. 678-685, 2000.
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